Communication Dans Un Congrès Année : 2024

Near-field characterization of Nb2CTx MXene by non-destructive nearfield microscopy

Résumé

The Nb2CTx MXene was synthesized and optically characterized utilizing Photo-induced Force Microscopy (PiFM), a nanoscale imaging technique combining AFM topography mapping and infrared spectroscopy. In both bulk and single/few layered MXene flakes, absorption peaks were observed in the 770 - 1860 cm-1 investigated range. The local IR spectra is compared with broader Fourier-transform infrared (FTIR) and Raman spectroscopy to analyse the material composition. Our findings notably highlight the presence of a characteristic peaks related to surface functional group in both far-field and near-field measurement. The spectra also indicate a strong contribution of niobium oxide in the synthetized material.
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hal-04618601 , version 1 (09-01-2025)

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Kevin Kim, Camilo Pérez de la Vega, Youssef El Helou, Enora Vuillermet, Kuan-Ting Wu, et al.. Near-field characterization of Nb2CTx MXene by non-destructive nearfield microscopy. SPIE OPTO, Jan 2024, San Francisco California, United States. pp.33, ⟨10.1117/12.3009437⟩. ⟨hal-04618601⟩
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