%0 Conference Paper %F Oral %T A Comparison of 2-D Simulations and Measurements of Low Frequency Noise on InGaP/GaAs HBT Transistors at Low and High Level Injection %+ C2S2 (XLIM-C2S2) %+ XLIM (XLIM) %+ Alcatel-Thalès III-V lab (III-V Lab) %+ UMS %A Abdelhadi, Khaled %A Al Hajjar, Ahmad %A Nallatamby, Jean-Christophe %A Jacquet, Jean-Claude %A Delage, Sylvain %A Prigent, Michel %A Floriot, Didier %< avec comité de lecture %B International Conference on Noise and Fluctuations %C Montpellier, France %8 2013-06-23 %D 2013 %Z Engineering Sciences [physics]Conference papers %G English %L hal-00914665 %U https://unilim.hal.science/hal-00914665 %~ UNILIM %~ CNRS %~ XLIM %~ XLIM-C2S2