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Communication Dans Un Congrès Année : 2013

Characterization of Transistor Drain Supply Terminal Impedance at Signal Envelope Frequencies

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Dates et versions

hal-00918779 , version 1 (14-12-2013)

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  • HAL Id : hal-00918779 , version 1

Citer

Zoya Popovic, Scott Schafer, David Sardin, Tibault Reveyrand. Characterization of Transistor Drain Supply Terminal Impedance at Signal Envelope Frequencies. International Microwave Symposium, Jun 2013, Seattle, United States. Workshop WMC. ⟨hal-00918779⟩

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