@article{ouerdi:hal-00981692, TITLE = {{Security Vulnerabilities Test Generation from SysML and Event-B models for EMV cards}}, AUTHOR = {Ouerdi, Noura and Azizi, Mostafa and Ziane, M'Hammed and Lanet, Jean-Louis and Savary, Aymerick}, URL = {https://unilim.hal.science/hal-00981692}, JOURNAL = {{International Journal of Security and Its Applications}}, VOLUME = {8}, NUMBER = {1}, PAGES = {373-388}, YEAR = {2014}, DOI = {10.14257/ijsia.2014.8.1.35}, KEYWORDS = {EMV ; Model-Based Testing ; Event-B ; SysML ; Smart card ; Vulnerability}, HAL_ID = {hal-00981692}, HAL_VERSION = {v1}, }