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Proceedings/Recueil Des Communications Année : 2010

Optical properties of dielectric thin films including quantum dots

François Flory
  • Fonction : Auteur
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Y. C. Chen
  • Fonction : Auteur
C. C. Lee
  • Fonction : Auteur
Ludovic Escoubas
Jean-Jacques Simon
  • Fonction : Auteur
Philippe Torchio
Judikaël Le Rouzo
Sylvain Vedraine


Depending on the minimum size of their micro/nano structure, thin films can exhibit very different behaviors and optical properties. From optical waveguides down to artificial anisotropy, through diffractive optics and photonic crystals, the application changes when decreasing the minimum feature size. Rigorous electromagnetic theory can be used to model most of the components but when the size is of a few nanometers, quantum theory has also to be used. These materials including quantum structures are of particular interest for other applications, in particular for solar cells, because of their luminescent and electronic properties. We show that the properties of electrons in multiple quantum wells can be easily modeled with a formalism similar to that used for multilayer waveguides. The effects of different parameters, in particular coupling between wells and well thickness dispersion, on possible discrete energy levels or energy band of electrons and on electron wave functions is given. When such quantum confinement appears the spectral absorption and the extinction coefficient dispersion with wavelength is modified. The dispersion of the real part of the refractive index can then be deduced from the Kramers- Krönig relations. Associated with homogenization theory this approach gives a new model of refractive index for thin films including quantum dots. Absorption spectra of samples composed of ZnO quantum dots in PMMA layers are in preparation are given.
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Dates et versions

hal-01245748 , version 1 (17-12-2015)



François Flory, Y. C. Chen, C. C. Lee, Ludovic Escoubas, Jean-Jacques Simon, et al.. Optical properties of dielectric thin films including quantum dots. Optics and Photonics - Nanostructured Thin Films III, France. 7766 (77660J), 2010, SPIE Proceedings, ⟨10.1117/12.859464⟩. ⟨hal-01245748⟩
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